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Joint Test Action Group
Results: 911

#	Item
771	An Ecomonical Alternative to Boundary Scan in Memory Devices Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2007-01-22 18:19:36 Manufacturing Boundary scan Design for testing Joint Test Action Group In-circuit test Automatic test pattern generation Integrated circuit design Input/output Reliability engineering Electronics manufacturing Electronic engineering Electronics
772	Xilinx UG445 CPLD I/O User Guide Add to Reading List Source URL: www.xilinx.com Language: English - Date: 2014-01-14 14:07:45 Complex programmable logic device Xilinx ISE Field-programmable gate array Joint Test Action Group Xilinx Application-specific integrated circuit Electronic engineering Electronics Electronics manufacturing
773	FOR IMMEDIATE RELEASE: Media Contact: Barbara Stewart Patterson & Associates Email: [removed] Add to Reading List Source URL: www.macraigor.com Language: English - Date: 2011-05-22 19:14:07 Computer architecture IEEE standards Instruction set architectures ARM architecture Microcontrollers Joint Test Action Group Debugger In-circuit emulator ARM Cortex-M Embedded systems Computing Electronics
774	SOLUTION BRIEF Dense FPGA Processing Engine High Bandwidth Interconnects And Powerful FPGAs Provide Dense Sensor Processing Engine Add to Reading List Source URL: www.vadatech.com Language: English - Date: 2014-03-09 00:36:06 Technology Fabless semiconductor companies Embedded systems Reconfigurable computing Xilinx Field-programmable gate array Advanced Mezzanine Card QorIQ Joint Test Action Group Computer buses Electronic engineering Electronics
775	TX27 System On Module • Processor Add to Reading List Source URL: www.karo-electronics.de Language: English - Date: 2010-11-04 10:00:50 Embedded systems Computer buses Serial Peripheral Interface Bus Universal Serial Bus Joint Test Action Group General Purpose Input/Output RS-232 Pinout Computer hardware Electronics Electronic engineering
776	MultiWriter On-board Bounded Add to Reading List Source URL: www.checksum.com Language: English - Date: 2012-04-18 17:00:24 Microcontrollers Electronics manufacturing Embedded systems Instruction set architectures Digital electronics Atmel AVR In-system programming In-circuit test Joint Test Action Group Electronics Electronic engineering Computer architecture
777	This Poster provides an overview of IEEE Std[removed]test mode entry and exit methods as well as examples for test logic implementations. IEEE Std 1581 drastically simplifies connectivity test for memory devices poten Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2011-09-27 22:35:01 Electronics manufacturing Embedded systems Digital electronics Logic gate Boundary scan XNOR gate Microcontroller Joint Test Action Group Electronic engineering Electronics Manufacturing
778	FOR IMMEDIATE RELEASE: Media Contact: Barbara Stewart Patterson & Associates Tel: [removed] Add to Reading List Source URL: www.macraigor.com Language: English - Date: 2011-05-22 19:12:34 Embedded systems Instruction set architectures Geode IEEE standards Advanced Micro Devices Joint Test Action Group In-circuit emulator X86 ARM architecture Computing Computer architecture Electronics
779	Microsoft Word - Macraigor Embedded Cross-Dev with Eclipse Whitepaper.doc Add to Reading List Source URL: www.macraigor.com Language: English - Date: 2011-05-22 19:16:23 Debuggers Embedded systems Eclipse Python GNU Debugger Joint Test Action Group Integrated development environment Debugging GNU Compiler Collection Software Computing Computer programming
780	Microsoft Word - OCDemon MIPS-Freescale Final1.doc Add to Reading List Source URL: www.macraigor.com Language: English - Date: 2011-05-22 19:16:30 Electronics Instruction set architectures Microcontrollers Power Architecture IEEE standards Joint Test Action Group MIPS Technologies GNU Debugger PowerPC Computer architecture Computing Embedded systems

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